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Sequential Analysis : Tests and Confidence Intervals, Hardcover by Siegmund, ...

Description: Sequential Analysis : Tests and Confidence Intervals, Hardcover by Siegmund, David, ISBN 0387961348, ISBN-13 9780387961347, Like New Used, Free shipping in the US The modern theory of Sequential Analysis came into existence simultaneously in the United States and Great Britain in response to demands for more efficient sampling inspection procedures during World War II. The develop ments were admirably summarized by their principal architect, A. Wald, in his book Sequential Analysis (1947). In spite of the extraordinary accomplishments of this period, there remained some dissatisfaction with the sequential probability ratio test and Wald's analysis of it. (i) The open-ended continuation region with the concomitant possibility of taking an arbitrarily large number of observations seems intol erable in practice. (ii) Wald's elegant approximations based on "neglecting the excess" of the log likelihood ratio over the stopping boundaries are not especially accurate and do not allow one to study the effect oftaking observa tions in groups rather than one at a time. (iii) The beautiful optimality property of the sequential probability ratio test applies only to the artificial problem of testing a simple hypothesis against a simple alternative. In response to these issues and to new motivation from the direction of controlled clinical trials numerous modifications of the sequential probability ratio test were proposed and their properties studied-often by simulation or lengthy numerical computation. (A notable exception is Anderson, 1960; see .) In the past decade it has become possible to give a more complete theoretical analysis of many of the proposals and hence to understand them better.

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Sequential Analysis : Tests and Confidence Intervals, Hardcover by Siegmund, ...

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Book Title: Sequential Analysis : Tests and Confidence Intervals

Number of Pages: Xi, 274 Pages

Language: English

Publication Name: Sequential Analysis : Tests and Confidence Intervals

Publisher: Springer New York

Publication Year: 1985

Subject: Probability & Statistics / General

Type: Textbook

Item Weight: 45.5 Oz

Subject Area: Mathematics

Item Length: 9.3 in

Author: David Siegmund

Item Width: 6.1 in

Series: Springer Series in Statistics Ser.

Format: Hardcover

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