Description: Multi-Chip Module Test Strategies, Paperback by Zorian, Yervant (EDT), ISBN 079239920X, ISBN-13 9780792399209, Like New Used, Free P&P in the UK MCMs today consist of dense VLSI devices mounted into packages that allow little physical access to internal modes, and the complexity and cost associated with their test and diagnosis are major obstacles to their use. Addressing the interests of engineers and designers, 14 contributions cover the necessary background on MCMs and MCM testing, the three major levels of manufacturing tests and their corresponding design-for-testability techniques, the key issues of diagnosing at the assembly level, various simulation techniques, and trade-offs related to diverse test solutions and their economic impact on MCM fabrication. Annotation c. by Book News, Inc., Portland, Or.
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Book Title: Multi-Chip Module Test Strategies
Number of Pages: 167 Pages
Language: English
Publication Name: Multi-Chip Module Test Strategies
Publisher: Springer
Publication Year: 1997
Subject: Physics
Item Height: 254 mm
Item Weight: 576 g
Type: Textbook
Author: Yervant Zorian
Subject Area: Electrical Engineering
Series: Frontiers in Electronic Testing
Item Width: 203 mm
Format: Hardcover
