Description: Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for ... / Materials Physics and Applications)by Robert McDonald,David G. Seiler,Alain C. Diebold Description: It's a preowned item in good condition and includes all the pages. It may have some general signs of wear and tear, such as markings, highlighting, slight damage to the cover, minimal wear to the binding, etc., but they will not affect the overall reading experience.Product ID: 0735404410-11-1-6
Price: 104.38 USD
Location: Philadelphia, Pennsylvania
End Time: 2025-02-01T15:14:12.000Z
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Book Title: Frontiers of Characterization and Metrology for Nanoelectronics:
Number of Pages: Xiv, 578 Pages
Publication Name: Frontiers of Characterization and Metrology for Nanoelectronics : 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
Language: English
Publisher: American Institute of Physics
Publication Year: 2007
Subject: Measurement, Industrial Engineering, Engineering (General), Electronics / Circuits / Vlsi & Ulsi, Nanotechnology & Mems, Electronics / General
Item Height: 0.6 in
Item Weight: 56.1 Oz
Type: Textbook
Item Length: 11 in
Subject Area: Technology & Engineering
Author: Alain C. Diebold
Series: Aip Conference Proceedings / Materials Physics and Applications Ser.
Item Width: 8.5 in
Format: Mixed Lot
