Description: Defect Analysis In Electron Microscopy M.H. Loretto, R.E. Smallman 1975 Illustrated HCDJ Halsted Press UK. Hard to find. Condition is Good with minor shelf wear as shown. Shipped with USPS Media Mail
Price: 74.99 USD
Location: Hamilton, Ohio
End Time: 2025-01-27T15:25:11.000Z
Shipping Cost: 4.63 USD
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Item Specifics
Return shipping will be paid by: Seller
All returns accepted: Returns Accepted
Item must be returned within: 30 Days
Refund will be given as: Money Back
Publication Year: 1975
Type: Textbook
Format: Hardcover
Subject Area: Material Science
Language: English
Publication Name: Defect Analysis In Electron Microscopy
Author: M.H. Loretto, R.E. Smallman
Features: Illustrated, Dust Jacket
Publisher: Halsted Press
Country/Region of Manufacture: United Kingdom
Subject: Materials Science
