Description: Characterization, Testing, Measurement, and Metrology by Chander Prakash, Sunpreet Singh, J. Paulo Davim Estimated delivery 3-12 business days Format Paperback Condition Brand New Description As the field of materials and manufacturing has progressed tremendously, there is a need for up-to-date knowledge with respect to the latest novelties, techniques and applications. Publisher Description This book presents the broad aspects of measurement, performanceanalysis, and characterization for materials and devices through advanced manufacturing processes. The field of measurement and metrology as a precondition for maintaining high-quality products, devices, and systems in materials and advanced manufacturing process applications has grown substantially in recent years.The focus of this book is to present smart materials in numerous technological sectors such as automotive, bio-manufacturing, chemical, electronics, energy, and construction. Advanced materials have novel properties and therefore must be fully characterized and studied in-depth so they can be incorporated into products that will outperform existing products and resolve current problems.The book captures the emerging areas of materials science and advanced manufacturing engineering and presents recent trends in research for researchers, field engineers, and academic professionals. Author Biography Chander Prakash, Sunpreet Singh, J. Paulo Davim Details ISBN 0367554941 ISBN-13 9780367554941 Title Characterization, Testing, Measurement, and Metrology Author Chander Prakash, Sunpreet Singh, J. Paulo Davim Format Paperback Year 2024 Pages 192 Publisher Taylor & Francis Ltd GE_Item_ID:161427167; About Us Grand Eagle Retail is the ideal place for all your shopping needs! With fast shipping, low prices, friendly service and over 1,000,000 in stock items - you're bound to find what you want, at a price you'll love! Shipping & Delivery Times Shipping is FREE to any address in USA. Please view eBay estimated delivery times at the top of the listing. Deliveries are made by either USPS or Courier. We are unable to deliver faster than stated. International deliveries will take 1-6 weeks. NOTE: We are unable to offer combined shipping for multiple items purchased. This is because our items are shipped from different locations. Returns If you wish to return an item, please consult our Returns Policy as below: Please contact Customer Services and request "Return Authorisation" before you send your item back to us. Unauthorised returns will not be accepted. Returns must be postmarked within 4 business days of authorisation and must be in resellable condition. Returns are shipped at the customer's risk. We cannot take responsibility for items which are lost or damaged in transit. For purchases where a shipping charge was paid, there will be no refund of the original shipping charge. Additional Questions If you have any questions please feel free to Contact Us. Categories Baby Books Electronics Fashion Games Health & Beauty Home, Garden & Pets Movies Music Sports & Outdoors Toys
Price: 94.29 USD
Location: Fairfield, Ohio
End Time: 2025-01-07T03:31:22.000Z
Shipping Cost: 0 USD
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Restocking Fee: No
Return shipping will be paid by: Buyer
All returns accepted: Returns Accepted
Item must be returned within: 30 Days
Refund will be given as: Money Back
Format: Paperback
Language: English
ISBN-13: 9780367554941
Author: Chander Prakash, Sunpreet Singh, J. Paulo Davim
Type: NA
Book Title: Characterization, Testing, Measurement, and Metrology
Publication Name: NA