Description: Please refer to the section BELOW (and NOT ABOVE) this line for the product details - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - Title:A User's Guide To EllipsometryISBN13:9780486450285ISBN10:0486450287Author:Tompkins, Harland G. (Author)Description:This Text On Optics For Graduate Students Explains How To Determine Material Properties And Parameters For Inaccessible Substrates And Unknown Films As Well As How To Measure Extremely Thin Films Its 14 Case Studies Illustrate Concepts And Reinforce Applications Of Ellipsometry -- Particularly In Relation To The Semiconductor Industry And To Studies Involving Corrosion And Oxide Growth A User's Guide To Ellipsometry Will Enable Readers To Move Beyond Limited Turn-Key Applications Of Ellipsometers In Addition To Its Comprehensive Discussions Of The Measurement Of Film Thickness And Optical Constants In Film, It Also Considers The Trajectories Of The Ellipsometric Parameters Del And Psi And How Changes In Materials Affect Parameters This Volume Also Addresses The Use Of Polysilicon, A Material Commonly Employed In The Microelectronics Industry, And The Effects Of Substrate Roughness Three Appendices Provide Helpful References Binding:Paperback, PaperbackPublisher:DOVER PUBN INCPublication Date:2006-07-07Weight:0.66 lbsDimensions:0.56'' H x 8.5'' L x 5.64'' WNumber of Pages:260Language:English
Price: 14.45 USD
Location: USA
End Time: 2024-10-25T15:30:47.000Z
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Book Title: A User's Guide To Ellipsometry
Item Length: 8.5in
Item Height: 0.6in
Item Width: 5.4in
Author: Nicholas Poussin, Harland G. Tompkins
Publication Name: User's Guide to Ellipsometry
Format: Perfect
Language: English
Publisher: Dover Publications, Incorporated
Series: Dover Civil and Mechanical Engineering Ser.
Publication Year: 2006
Type: Textbook
Item Weight: 10.5 Oz
Number of Pages: 272 Pages
